Silicon wafer effective carrier measurement device 'VWECER-100-S'
Significantly reduce manufacturing costs! Effective carrier measurement device for silicon wafers used in solar cells.
The "VWECER-100-S" conducts quality measurements of silicon wafers using the newly developed technology "HS-CMR method" at Tohoku University’s Institute of Metal Materials Research. Since it is possible to accurately determine and sort the quality at the wafer stage, low-quality wafers can be eliminated without being turned into cells. This allows for the reduction of waste in the cell manufacturing process and improves the yield rate. 【Features】 ■ Measures all elements related to energy conversion efficiency within silicon wafers (electrons, holes, defects, impurities, etc.) ■ Capable of measuring the performance of silicon wafers as solar cells as "potential conversion efficiency," which cannot be confirmed visually ■ Can sort out silicon wafers with low potential conversion efficiency without turning them into cells ■ Can significantly reduce manufacturing costs ■ Can also contribute to the improvement of pn junction technology *For more details, please feel free to contact us.
- 企業：パンソリューションテクノロジーズ
- 価格：Other
